Collector Currentįigure 14. Fall Time vs. Collector Currentįigure 13. Storage Time vs. Turn-On Time vs. Collector Currentįigure 12. Current Gain and Phase Angle vs.įigure 11. Collectorįigure 2. Collector-Emitter Saturation Voltage vs.įigure 3. Base-Emitter Saturation Voltageįigure 6. Capacitance vs. Reverse Bias Voltageįigure 8. Noise Figure vs. ![]() Operating and Storage Junction Temperature Rangeįigure 1. Typical Pulsed Current Gain vs. Values are at Tġ. These ratings are based on a maximum junction temperature of 150Ģ. These are steady-state limits. Fairchild Semiconductor should be consulted on applications involving pulsed orģ. Device is mounted on FR-4 PCB 1.6 inch X 1.6 inch X 0.06 inch.Ĥ. Device is mounted on FR-4 PCB 36 mm X 18 mm X 1.5 mm, mounting pad for the collector lead minimum 6 cm In addi- tion, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only. Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be opera- ble above the recommended operating conditions and stressing the parts to these levels is not recommended. ![]() © 2002 Fairchild Semiconductor Corporation
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